Morphology and N2 Permeance of Sputtered Pd-Ag Ultra-Thin Film Membranes

نویسندگان
چکیده

برای دانلود باید عضویت طلایی داشته باشید

برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید

اگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید

منابع مشابه

Morphology and N₂ Permeance of Sputtered Pd-Ag Ultra-Thin Film Membranes.

The influence of the temperature during the growth of Pd-Ag films by PVD magnetron sputtering onto polished silicon wafers was studied in order to avoid the effect of the support roughness on the layer growth. The surfaces of the Pd-Ag membrane films were analyzed by atomic force microscopy (AFM), and the results indicate an increase of the grain size from 120 to 250-270 nm and film surface rou...

متن کامل

Characterization of nanostructured SnO2 thin film coated by Ag nanoparticles

Nanostructured SnO2 thin films were prepared using Electron Beam-Physical Vapor Deposition (EB-PVD) technique. Then Ag nanoparticles synthesized by laser-pulsed ablation were sprayed on the films. In order to form a homogenous coated of SnO2 on the glass surface, it was thermally treated at 500°C for 1 h. At this stage, the combined layer on the substrate was completely dried for 8 h in the air...

متن کامل

Structure and electrocatalysis of sputtered RuPt thin-film electrodes.

The structural and electrochemical properties of RuPt thin-film electrodes fabricated by radio frequency (rf) magnetron sputtering have been investigated. Grazing incidence X-ray diffraction data show a transition from a face-centered cubic (fcc) to hexagonal cubic-packed (hcp) structure as the Ru percentage increases. The transition occurs gradually between 32 and 58% Ru, which is significantl...

متن کامل

Structure and morphology of magnetron sputtered CoCr thin films

The growth characteristics of magnetron sputtered Co-22%Cr thin films on amorphous glass or carbon substrates have been investigated utilizing transmission electron microscopy, X-ray diffraction and electrical resistivity measurements. Results indicate that the initial deposit is “amorphous”. but that small crystallites form before the film reaches 5 nm film thickness. By 10 nm, well oriented g...

متن کامل

Modification of Thin Film Properties by Sputtered Particles

Irrespective of thin film preparation methods such as PVD and CVD, the thin film process comprises three elementary stages including decomposition, transport, and nucleation and growth mechanisms. Fig. 1 shows the flow chart of the thin film process, where starting materials are successively modified to the resulting films. In the first stage, starting materials in the form of gas, liquid or so...

متن کامل

ذخیره در منابع من


  با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید

ژورنال

عنوان ژورنال: Molecules

سال: 2016

ISSN: 1420-3049

DOI: 10.3390/molecules21020210